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Test System
BMS HIL
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Test Automation Platform Developer's System
KS8400A
The Keysight KS8400A Test Automation Platform (TAP) Developer's System provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. Keysight TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher-level test executive software environments. Leveraging C# and the power of Microsoft Visual Studio, TAP is not just another programming language. It's a platform upon which you can build your test solutions, maximizing your team's productivity by using your existing software development tools and infrastructure.
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Advanced Test Platform
980b
The Teledyne LeCroy quantumdata 980B platform is a modular based system that can accommodate up to three (3) to four (4) 980 series modules depending the modules configured. The 980B platform and its modules can be controlled either through the PC-based 980 GUI Manager or through the embedded 980 GUI Manager running on the 980B platform itself. The 980B Test Platform’s built-in color touch screen provides a graphical user interface (GUI) to control the instrument and to view incoming video and metadata in the Real Time mode when using the 980 modules with analyzer functions.
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Automated Compliance and Device Characterization Tests
N5990A
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexibl...show more -
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3D Semiconductor & MEMS Process Modeling Platform
SEMulator3D
SEMulator3D® is a powerful 3D semiconductor and MEMS process modeling platform that offers wide ranging technology development capabilities. Based on highly efficient physics-driven voxel modeling technology, SEMulator3D has a unique ability to model complete process flows. Starting from input design data, SEMulator3D follows an integrated process flow description to create the virtual equivalent of the complex 3D structures created in the fab. Because the full integrated process sequence is modeled, SEMulator3D has the ability to predict downstream ramifications of process changes that would otherwise require build-and-test cycles in the fab.
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Power-Switching Test System
High Voltage Switching Test System
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Modular Test Platform
MPA®Multi-Protocol Analyzer
The MPA® Multi-Protocol Analyzer is an advanced packet optical transport traffic generation and analysis platform specifically designed for the demands of R&D, SVT, and manufacturing testing environments. The MPA provides simultaneous independent multi-port testing from 1G to 400G for Ethernet/IP, OTN & SDH/SONET and Fibre Channel.
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TOROIDAL COIL TURNS TESTER
TURNS-TTPT
Digital TURNS TESTER for Counting Number of Turns for Toroidal Coils , Current Sensor , Current Transformer , Round Core Coils. Can measure, Turns along with Winding Polarity and DC Resistance.Turns Measurement ( through Toroidal Turns Test Platform) : -> TTPT-100 : 5 Turns ~ 1000Turns-> TTPT-1000 : 500 Turns ~ 10,000Turns
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6TL29 Semi-Automated Test Platform
AQ377
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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ULTRA® Contactors
ULTRA CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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VXI
VXI stands for VME eXtensions for Instrumentation. It is an open standard first developed by five leading Test and Measurement companies in 1987 to standardise a backplane capable of developing open, interchangeable instrument modules that could be used to build Automatic Test Equipment (ATE).Data Patterns designs and markets a wide range of VXI modules, some of which are listed below. Due to the use of the latest technologies, Data Patterns VXI modules offer the highest I/O density available in...show more -
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ICE 3000 Series
ICE3001
This subsystem is an agile filter for the SATCOM frequency band, capable of acting as either a receive or a transmit filter. It enables simultaneous operation of multiple transceivers in extreme cosite environments. The ICE3001 provides multiple poles of RF selectivity to reduce broadband noise, harmonics, and spurious signals for either receive or transmit applications. This filter is a highly integrated design incorporating complete Built-in-Test capability. The design has been qualified for military applications. A dual-mount tray is also available as an option for easy incorporation on your platform. Cost-effective modifications are available on the ICE3001.
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Scalable Test Solution for Mixed-Technology Test Applications
Spectrum RF Systems
The Spectrum RF Systems are fully integrated, configurable test platforms combining several digital, analog, RF, and switching instruments to provide automated functional test solutions for a wide range of mixed-signal and microwave test applications including radars, Electronic Warfare, missile, and satellite communications.
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Striptest Contactors
ULTRA® CONTACT Series
ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Continuous Time Interval Analyzers
GT668PXIe-40
GuideTech’s GT668PXIe-40 PXI 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system at low cost. High accuracy 50MHz time base with NIST traceable calibration. Some of the GT668PXIe-40 measurements include Jitter measurements, PLL & Clock Jitter, Spread Spectrum Modulation, PLL Lock Time, Frequency, Period, Pulse Width, Skew, Tpd, Rise/Fall Time, Time Interval Error and more.
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Modular Functional Testing Platform
OTP2
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Durability, Noise & Vibration Test Platform
LMS Test.Lab
Siemens Digital Industries Software
LMS Test.Lab with faster, more accessible and more complete test-based engineering for noise, vibration and durability. From multichannel data acquisition to a full suite of testing, analysis and reporting solutions, LMS Test.Lab 15 provides you with a versatile and rigorous problem-solving toolkit.
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3U PXI-E System Controller
PX32101
LinkedHope Intelligent Technologies Co.,Ltd.
PX32101 is a 3U PXI-E system controller based on the newest Intel® Haswell platform. It is designed to provide comprehensive and reliable system controller to support hybrid PXIe-based systems for multiple environments test and measurement applications.Hybrid PXIe-based systems are often required to complete independent diversified complex testing tasks on the PXI test platform. PX32101 provides rich interfaces: 4 USB2.0 / 3.0 for peripheral connectivities; UART for communication or control equi...show more -
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Automotive Production Board Test
Teradyne's TestStation platform enables manufacturers to easily react to rapidly changing product requirements. From volume, mix and test complexity - there is a TestStation configuration to meet your production requirements at the highest fault coverage and yield rate. configurable from a range of a few test points for basic shorts detection up to more than 15,000 test points for more complex PCBAs.
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Inbuilt External Controller ATE with Touch Screen Features
QT 200NXT
Qmax Test Technologies Pvt. Ltd.
QT 200 nxT is a ultra modern stylish Inbuilt external controller ATE with touch screen features, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the comb...show more -
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Virtual Universal Testing Platform
vUTP
The NetResearch virtual Universal Testing Platform (vUTP) is an intuitive and user-friendly platform that enables you to run and schedule a wide range of tests operating on different layers. vUTP utilizes hybrid cloud infrastructure so you can monitor assets from global and local perspectives without any additional effort or investment. The scalable design ensures cost-effectiveness for our clients while the vUTP dashboard provides a great user experience and immediate information about the status of your infrastructure.
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Environmental Control System Test Platform
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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Test Automation Platform Deployment System
KS8000A
TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments. The Keysight KS8000A Test Automation Platform (TAP) Deployment System provides a lower cost, scaled down alternative to the full KS8400A TAP Developers System without the graphical user interface, results viewer and timing analyzer. Deploy your existing test software and TAP plugins into manufacturing environments using the KS8000A command line interface or your own interfaces.
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Cloud Semiconductor Testing Service
CloudTesting™
All-in-one platform for semiconductor test and measurement Extensive test and measurement library Microcontroller, Memory, Analog and more. CloudTesting™ Service is the test and measurement system that you can build your own environment by selecting and combining Testing IPs. Fees for Testing IPs are paid monthly.
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CO (Carbon Monoxide) Gas Sensor
605-00007
The CO Gas Sensor is used in gas detection equipment for detecting Carbon Monoxide in home, automotive or industrial settings. When paired with our Gas Sensor Board (#27983) it provides a development system and test platform for CO gas sensor design.
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Desktop DMA
Desktop Series
DMA25 and DMA50 are “desktop” Dynamic Mechanical Analyzers offering a high force range and outstanding flexibility. From glass transition determination to immersed tests, they make powerful and very cost-effective thermomechanical testing platforms.
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Probe Card
VC20E Series
The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. Probes can be configured in either single or dual layer.
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Java Test Platform
JUnit 5
JUnit 5 is the next generation of JUnit. The goal is to create an up-to-date foundation for developer-side testing on the JVM. This includes focusing on Java 8 and above, as well as enabling many different styles of testing.
